Yield prediction in semiconductor manufacturing using an AI-based cascading classification system. - Peter Stich; Michael G. Wahl; Peter Czerner; Christian Weber 003; Madjid Fathi (EIT, 2020)

A Text Extraction-Based Smart Knowledge Graph Composition for Integrating Lessons Learned During the Microchip Design. - Hasan Abu Rasheed; Christian Weber 003; Johannes Zenkert; Peter Czerner; Roland Krumm; Madjid Fathi (IntelliSys (2), 2020)

Clustering Wafer Defect Patterns Within the Semiconductor Industry Based on Wafer Maps, Using an Agile Unsupervised Deep Learning Approach. - Christian Weber 003; A. Tripuramallu; Peter Czerner; Madjid Fathi (SMC, 2021)

Digit-DM: A Sustainable Data Mining Modell for Continuous Digitization in Manufacturing. - Christian Weber 003; Peter Czerner; Madjid Fathi (eIT, 2023)