Transistor Fault Coverage for Self-Testing CMOS Checkers. - Peter Lidén; Peter Dahlgren; Jan Torin (ITC, 1992)

Efficient modeling of switch-level networks containing undetermined logic node states. - Peter Dahlgren; Peter Lidén (ICCAD, 1993)

Modeling of Intermediate Node States in switch-Level Networks. - Peter Dahlgren; Peter Lidén (DAC, 1994)

On Latching Probability of Particle Induced Transients in Combinational Networks. - Peter Lidén; Peter Dahlgren; Rolf Johansson 002; Johan Karlsson (FTCS, 1994)

Using heavy-ion radiation to validate fault-handling mechanisms. - Johan Karlsson; Peter Lidén; Peter Dahlgren; Rolf Johansson 002; Ulf Gunneflo (IEEE Micro, 1994)

A Switch-level Algorithm for Simulation of Transients in Combinational Logic. - Peter Dahlgren; Peter Lidén (FTCS, 1995)

A multiple-dominance switch-level model for simulation of short faults. - Peter Dahlgren (ICCAD, 1995)

Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers. - Peter Lidén; Peter Dahlgren (ISCAS, 1995)

Switch-level modeling of transistor-level stuck-at faults. - Peter Lidén; Peter Dahlgren (VTS, 1995)

Switch-Level Fault Simulation Based on Local Algorithms. - Peter Dahlgren (1995)

Oscillation Control in Logic Simulation using Dynamic Dominance Grahps. - Peter Dahlgren (DAC, 1996)

A fault model for switch-level simulation of gate-to-drain shorts. - Peter Dahlgren; Peter Lidén (VTS, 1996)

Switch-level modeling of feedback faults using global oscillation control. - Peter Dahlgren (VTS, 1997)

Switch-level bridging fault simulation in the presence of feedbacks. - Peter Dahlgren (ITC, 1998)

Latch Divergency In Microprocessor Failure Analysis. - Peter Dahlgren; Paul Dickinson; Ishwar Parulkar (ITC, 2003)

Microprocessor silicon debug based on failure propagation tracing. - Olivier Caty; Peter Dahlgren; Ismet Bayraktaroglu (ITC, 2005)

Transition Test on UltraSPARC- T2 Microprocessor. - Liang-Chi Chen; Paul Dickinson; Prasad Mantri; Murali M. R. Gala; Peter Dahlgren; Subhra Bhattacharya; Olivier Caty; Kevin Woodling; Thomas A. Ziaja; David Curwen; Wendy Yee; Ellen Su; et al. (ITC, 2008)

Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family. - Liang-Chi Chen; Paul Dickinson; Peter Dahlgren; Scott Davidson 001; Olivier Caty; Kevin Wu (ITC, 2009)

Transition test bring-up and diagnosis on UltraSPARCTM processors. - Liang-Chi Chen; Peter Dahlgren; Paul Dickinson; Scott Davidson 001 (ITC, 2011)

Social Media and Counter-Democracy: The Contingences of Participation. - Peter Dahlgren (ePart, 2012)