Alternativen für den Einsatz der EDV in der Ausbildung von Industriekaufleuten bei VW. - Peter Egger (INFOS, 1989)

Application of time resolved emission techniques within the failure analysis flow. - Peter Egger; Markus Grützner; Christian Burmer; Fabien Dudkiewicz (Microelectron. Reliab., 2007)

Investigation of low temperature SRAM and ROM failures to enable the replacement of cold test insertion by room temperature test. - Stefan Müller; Peter Egger (Microelectron. Reliab., 2007)

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Ted R. Lundquist; Peter Egger; Christian Boit (Microelectron. Reliab., 2009)

Integrated flow for reverse engineering of nanoscale technologies. - Bernhard Lippmann; Michael Werner; Niklas Unverricht; Aayush Singla; Peter Egger; Anja Dübotzky; Horst A. Gieser; Martin Rasche; Oliver Kellermann; Helmut Graeb (ASP-DAC, 2019)

Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies. - Bernhard Lippmann; Niklas Unverricht; Aayush Singla; Matthias Ludwig 005; Michael Werner; Peter Egger; Anja Dübotzky; Helmut Gräb; Horst A. Gieser; Martin Rasche; Oliver Kellermann (Integr., 2020)