p-HEMT with tailored field. - Samson Mil'shtein; Peter Ersland; Shivarajiv Somisetty; C. Gil (Microelectron. J., 2003)

Lifetime acceleration model for HAST tests of a pHEMT process. - Peter Ersland; Hei-Ruey Jen; Xinxing Yang (Microelectron. Reliab., 2004)

Heterojunction semiconductor triode - a new vertical device. - Samson Mil'shtein; C. Gil; Peter Ersland (Microelectron. J., 2005)

Reliability investigation and characterization of failure modes in Schottky diodes. - Shivarajiv Somisetty; Peter Ersland; Xinxing Yang; Jason Barrett (Microelectron. Reliab., 2006)

Progress of quantum electronics and the future of wireless technologies. - Samson Mil'shtein; Peter Ersland (Microelectron. J., 2008)

Determining DC/RF survivability limits of GaAs semiconductor circuits. - C. Gil; Peter Ersland; A. Li (Microelectron. Reliab., 2009)

Editorial. - Peter Ersland; Roberto Menozzi (Microelectron. Reliab., 2012)

Reliability validation of compound semiconductor foundry processes. - Peter Ersland; Shivarajiv Somisetty (Microelectron. Reliab., 2012)