Electrostatic Effects on Semiconductor Tools. - Peter Jacob; Joachim C. Reiner (Microelectron. Reliab., 2004)

Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. - Peter Jacob; Uwe Thiemann; Joachim C. Reiner (Microelectron. Reliab., 2005)

Reliability and wearout characterisation of LEDs. - Peter Jacob; Albert Kunz; Giovanni Nicoletti (Microelectron. Reliab., 2006)

Device decapsulated (and/or depassivated) - Retest ok - What happened? - Peter Jacob; Giovanni Nicoletti; Florian Hauf (Microelectron. Reliab., 2007)

Surface ESD (ESDFOS) in assembly fab machineries as a functional and reliability risk - Failure analysis, tool diagnosis and on-site-remedies. - Peter Jacob (Microelectron. Reliab., 2008)

Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures. - Peter Jacob; Werner Rothkirch (Microelectron. Reliab., 2008)

Reading distance degradation mechanisms of near-field RFID devices. - Peter Jacob; Willy Knecht; Albert Kunz; Giovanni Nicoletti; Thomas Lautenschlager; Moreno Mondada; Damien Pachoud (Microelectron. Reliab., 2009)

Impact of IT-supported clinical pathways on medical staff satisfaction. A prospective longitudinal cohort study. - Jochen Schuld; Thilo Schäfer; Stefan Nickel; Peter Jacob; Martin K. Schilling; Sven Richter (Int. J. Medical Informatics, 2011)

From component to system failure analysis - The future challenge within work-sharing supply chains. - Peter Jacob (Microelectron. Reliab., 2011)

Failure causes generating aluminium protrusion/extrusion. - Peter Jacob; Giovanni Nicoletti (Microelectron. Reliab., 2013)

Unusual defects, generated by wafer sawing: An update, including pick&place processing. - Peter Jacob (Microelectron. Reliab., 2015)

Failure analysis and reliability on system level. - Peter Jacob (Microelectron. Reliab., 2015)

Early life field failures in modern automotive electronics - An overview; root causes and precautions. - Peter Jacob (Microelectron. Reliab., 2016)

Failure mechanisms and precautions in plug connectors and relays. - Peter Jacob (Microelectron. Reliab., 2016)

A very unusual transistor failure, caused by a solenoid. - Peter Jacob; Roman Furrer (Microelectron. Reliab., 2017)

New ESD challenges in RFID manufacturing. - Peter Jacob; Uwe Thiemann (Microelectron. Reliab., 2017)

Toward an Optimal Definition of Hypoglycemia with Continuous Glucose Monitoring. - Zeinab Mahmoudi; Simone Del Favero; Peter Jacob; Pratik Choudhary; Hypo-RESOLVE Consortium (Comput. Methods Programs Biomed., 2021)

Balancing Cobot Productivity and Longevity Through Pre-Runtime Developer Feedback. - Emil Stubbe Kolvig Raun; Jakob Hviid; Mikkel Baun Kjærgaard; Ralph Brorsen; Peter Jacob (IEEE Robotics Autom. Lett., 2025)