Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. - H.-D. Oberle; Peter Muhmenthaler (ITC, 1991)

Enhanced fault modeling for DRAM test and analysis. - H.-D. Oberle; M. Maue; Peter Muhmenthaler (VTS, 1991)

Cost effective testing of systems on silicon: areas for optimization. - Peter Muhmenthaler (ETW, 1999)

Tutorial Statement. - Yervant Zorian; Michael Nicolaidis; Peter Muhmenthaler; David Y. Lepejian; Chris W. H. Strolenberg; Kees Veelenturf (DATE, 2000)

Embedded tutorial: TRP: integrating embedded test and ATE. - Yervant Zorian; Paolo Prinetto; João Paulo Teixeira 001; Isabel C. Teixeira; Carlos Eduardo Pereira; Octávio Páscoa Dias; Jorge Semião; Peter Muhmenthaler; W. Radermacher (DATE, 2001)

Outsourcing Test without Standards? - Peter Muhmenthaler (ITC, 2002)

Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. - Frank Poehl; Matthias Beck; Ralf Arnold; Peter Muhmenthaler; Nagesh Tamarapalli; Mark Kassab; Nilanjan Mukherjee 001; Janusz Rajski (ITC, 2003)

Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. - Andreas Leininger; Michael Gössel; Peter Muhmenthaler (DATE, 2004)

Compression mode diagnosis enables high volume monitoring diagnosis flow. - Andreas Leininger; Peter Muhmenthaler; Wu-Tung Cheng; Nagesh Tamarapalli; Wu Yang; Kun-Han Hans Tsai (ITC, 2005)

New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. - Peter Muhmenthaler (MTDT, 2006)

Session Abstract. - Ajay Khoche; Peter Muhmenthaler (VTS, 2006)