HZO-based Nonvolatile SRAM Array with 100% Bit Recall Yield and Sufficient Retention Time at 85°C. - Yusuke Shuto; Jun Okuno; Tsubasa Yonai; Ryo Ono; Peter Reinig; Maximilian Lederer; Konrad Seidel; Ruben Alcala; Thomas Mikolajick; Uwe Schroeder; Taku Umebayashi; Kentaro Akiyama (VLSI Technology and Circuits, 2024)

Enhanced Ferroelectricity in Hf0.5Zr.5O2 Thin Films by NLA at Intermediate Laser Energy Density. - David Lehninger; Tianren Zhang; Peter Reinig; Justine Barbot; Mathieu Opprecht; Sébastien Kerdilès; Laurent Grenouillet; Konrad Seidel; Maximilian Lederer (ICICDT, 2025)