A view of a user-oriented production test data generation system. - Peter S. Bottorff; Robert A. Rasmussen (DAC, 1970)

An automatic system approach to the problem of memory circuit testing & fault diagnosis. - Peter S. Bottorff; Mitchel E. Schwass; Francis J. Villante (DAC, 1970)

Test generation for large logic networks. - Peter S. Bottorff; Richard E. France; N. H. Garges; E. J. Orosz (DAC, 1977)

Automatic checking of logic design structures For compliance with testability ground rules. - Humbert C. Godoy; G. B. Franklin; Peter S. Bottorff (DAC, 1977)

Functional Testing Folklore and Fact. - Peter S. Bottorff (ITC, 1981)

Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits. - Peter S. Bottorff (ITC, 1982)

Design of testable logic circuits. - Peter S. Bottorff (Proc. IEEE, 1986)