Automotive EEPROM Qualification and Cost Optimization. - Peter Sarson; Gregor Schatzberger; Robert Seitz (Asian Test Symposium, 2013)

RF filter characterization using a chirp. - Peter Sarson (IDT, 2014)

Group delay filter measurement using a chirp. - Peter Sarson (ETS, 2016)

Very low supply voltage room temperature test to screen low temperature soft blown fuse fails which result in a resistive bridge. - Peter Sarson (ISQED, 2016)

Variation and failure characterization through pattern classification of test data from multiple test stages. - Chun-Kai Hsu; Peter Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger; John M. Carulli Jr.; Siddhartha Siddhartha; Kwang-Ting Cheng (ITC, 2016)

Test time efficient group delay filter characterization technique using a discrete chirped excitation signal. - Peter Sarson (ITC, 2016)

Yield improvement of an EEPROM for automotive applications while maintaining high reliability. - Gregor Schatzberger; Friedrich Peter Leisenberger; Peter Sarson (VTS, 2016)

Fault-based test methodology for analog amplifier circuits. - Josip Mikulic; Peter Sarson; Gregor Schatzberger; Adrijan Baric (EWDTS, 2017)

Use models for extending IEEE 1687 to analog test. - Peter Sarson; Jeff Rearick (ITC, 2017)

A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. - Stephen Sunter; Peter Sarson (ITC, 2017)

Automated die inking: A pattern recognition-based approach. - Constantinos Xanthopoulos; Peter Sarson; Heinz Reiter; Yiorgos Makris (ITC, 2017)

An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard. - Enea Bagalini; Jacopo Sini; Matteo Sonza Reorda; Massimo Violante; H. Klimesch; Peter Sarson (LATS, 2017)

Innovative practices session 7C automotive quality assurance. - Peter Sarson (VTS, 2017)

Innovative practices session 5C automotive test solutions. - Pete Sarson; Stefano Di Carlo (VTS, 2017)

A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm. - Peter Sarson; Shohei Shibuya; Tomonori Yanagida; Haruo Kobayashi 001 (VTS, 2017)

An ATE Filter Characterization ToolKit Using a Discrete Chirped Excitation Signal as Stimulus. - Peter Sarson (J. Electron. Test., 2017)

Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs. - Peter Sarson; Haruo Kobayashi 001 (J. Electron. Test., 2017)

Fast Bit Screening of Automotive Grade EEPROMs - Continuous Improvement Exercise. - Peter G. Sarson; Gregor Schatzberger; Friedrich Peter Leisenberger (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard. - Jacopo Sini; Matteo Sonza Reorda; Massimo Violante; Peter Sarson (IOLTS, 2018)

Online information utility assessment for per-device adaptive test flow. - Yanjun Li; Ender Yilmaz; Peter Sarson; Sule Ozev (VTS, 2018)

Group delay measurement of frequency down-converter devices using chirped RF modulated signal. - Peter Sarson; Tomonori Yanagida; Kosuke Machida (VTS, 2018)

IP session on ISO26262 EDA. - Art Schaldenbrand; Yervant Zorian; Stephen Sunter; Peter Sarson (VTS, 2018)

High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. - Gregor Schatzberger; Friedrich Peter Leisenberger; Peter Sarson; Andreas Wiesner (VTS, 2018)

Special session on BIST/calibration of A/MS devices. - Hans-Mart von Staudt; James Izon; Sule Ozev; Peter Sarson (VTS, 2018)

Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. - Peter Sarson; Tomonori Yanagida; Kosuke Machida (J. Electron. Test., 2018)

A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. - Peter Sarson; Tomonori Yanagida; Shohei Shibuya; Kosuke Machida; Haruo Kobayashi 001 (J. Electron. Test., 2018)

Automated Die Inking through On-line Machine Learning. - Constantinos Xanthopoulos; Arnold Neckermann; Paulus List; Klaus-Peter Tschernay; Peter Sarson; Yiorgos Makris (IOLTS, 2019)

Innovative Practices on Automotive Test. - Wim Dobbelaere; Marco Restifo; Peter Sarson (VTS, 2019)

Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements. - Yanjun Li; Ender Yilmaz; Pete Sarson; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2019)