Trifocal transfer on commodity graphics hardware. - Christian Weigel; Peter Schubel (EUSIPCO, 2007)

A Comprehensive Survey on Machine Learning Driven Material Defect Detection: Challenges, Solutions, and Future Prospects. - Jun Bai; Di Wu 050; Tristan Shelley; Peter Schubel; David Twine; John Russell; Xuesen Zeng; Ji Zhang 001 (CoRR, 2024)

A Comprehensive Survey on Machine Learning Driven Material Defect Detection. - Jun Bai; Di Wu 050; Tristan Shelley; Peter Schubel; David Twine; John Russell; Xuesen Zeng; Ji Zhang 001 (ACM Comput. Surv., 2025)