Threshold energies in the light emission characteristics of silicon MOS tunnel diodes. - N. Asli; M. I. Vexler; A. F. Shulekin; P. Douglas Yoder; I. V. Grekhov; Peter Seegebrecht (Microelectron. Reliab., 2001)

On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. - Jan-Werner Zahlmann-Nowitzki; Lars Nebrich; Peter Seegebrecht (Microelectron. Reliab., 2001)

Efficiency of body biasing in 90-nm CMOS for low-power digital circuits. - Klaus von Arnim; Eduardo Borinski; Peter Seegebrecht; Horst Fiedler; Ralf Brederlow; Roland Thewes; Jörg Berthold; Christian Pacha (IEEE J. Solid State Circuits, 2005)