MOSFET scaling trends and challenges through the end of the roadmap. - Peter M. Zeitzoff (CICC, 2004)

Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. - Gennadi Bersuker; Jang H. Sim; Chadwin D. Young; Rino Choi; Peter Zeitzoff; George A. Brown; Byoung Hun Lee; Robert W. Murto (Microelectron. Reliab., 2004)

Probing stress effects in HfO2 gate stacks with time dependent measurements. - Chadwin D. Young; Gennadi Bersuker; Yuegang Zhao; Jeff J. Peterson; Joel Barnett; George A. Brown; Jang H. Sim; Rino Choi; Byoung Hun Lee; Peter Zeitzoff (Microelectron. Reliab., 2005)

Effective Drive Current in Scaled FinFET and NSFET CMOS Inverters. - Ali Razavieh; Y. Deng; Peter Zeitzoff; M. R. Na; J. Frougier; Gauri Karve; D. E. Brown; T. Yamashita; Edward J. Nowak (DRC, 2018)