A VLSI implementation of logarithmic and exponential functions using a novel parabolic synthesis methodology compared to the CORDIC algorithm. - Peyman Pouyan; Erik Hertz; Peter Nilsson 001 (ECCTD, 2011)

New reliability mechanisms in memory design for sub-22nm technologies. - Nivard Aymerich; A. Asenov; Andrew R. Brown; Ramon Canal; Binjie Cheng; Joan Figueras; Antonio González 001; Enric Herrero; S. Markov; Miguel Miranda; Peyman Pouyan; Tanausú Ramírez; et al. (IOLTS, 2011)

Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (VTS, 2012)

Design and implementation of an adaptive proactive reconfiguration technique for SRAM caches. - Peyman Pouyan; Esteve Amat; Francesc Moll; Antonio Rubio 001 (DATE, 2013)

Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches. - Peyman Pouyan; Esteve Amat; Enrique Barajas; Antonio Rubio 001 (ISQED, 2014)

Statistical lifetime analysis of memristive crossbar matrix. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (DTIS, 2015)

Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (ECCTD, 2015)

Analysis and design of an adaptive proactive reconfiguration approach for memristive crossbar memories. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (NANOARCH, 2015)

Adaptive Proactive Reconfiguration: A Technique for Process-Variability- and Aging-Aware SRAM Cache Design. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Monitoring SRAM BTI degradation by current-based tracking technique. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (NEWCAS, 2016)

RRAM variability and its mitigation schemes. - Peyman Pouyan; Esteve Amat; Said Hamdioui; Antonio Rubio 001 (PATMOS, 2016)

Test and Reliability of Emerging Non-volatile Memories. - Said Hamdioui; Peyman Pouyan; Huawei Li 001; Ying Wang 001; Arijit Raychowdhury; Insik Yoon (ATS, 2017)

Standards-based tools and services for building lifelong learning pathways. - Cleo Sgouropoulou; Ioannis Voyiatzis; Anastasios Koutoumanos; Said Hamdioui; Peyman Pouyan; M. Comte; Paolo Prinetto; Giuseppe Airo Farulla; Peeter Ellervee; Carlos Delgado Kloos; Raquel M. Crespo García (EDUCON, 2017)

Reliability issues in RRAM ternary memories affected by variability and aging mechanisms. - Antonio Rubio 001; Manuel Escudero; Peyman Pouyan (IOLTS, 2017)

Resistive Random Access Memory Variability and Its Mitigation Schemes. - Peyman Pouyan; Esteve Amat; Said Hamdioui; Antonio Rubio 001 (J. Low Power Electron., 2017)

State of the art and challenges for test and reliability of emerging nonvolatile resistive memories. - Elena-Ioana Vatajelu; Peyman Pouyan; Said Hamdioui (Int. J. Circuit Theory Appl., 2018)

Memristive Crossbar Memory Lifetime Evaluation and Reconfiguration Strategies. - Peyman Pouyan; Esteve Amat; Antonio Rubio 001 (IEEE Trans. Emerg. Top. Comput., 2018)