Application of quantitative modal analysis for investigation of thermal degradation of microelectronic packages. - Peyman Rafiee; Golta Khatibi; N. Nelhiebel; Rainer Pelzer (Microelectron. Reliab., 2013)

A fast reliability assessment method for Si MEMS based microcantilever beams. - Peyman Rafiee; Golta Khatibi (Microelectron. Reliab., 2014)