Criteria for analyzing high frequency testing performance of VLSI automatic test equipment. - Phil Burlison (ITC, 1990)

The Waveform and Vector Exchange Specification (WAVES). - Larry Moran; Robert Hillman; Phil Burlison; Tom Gurda (ITC, 1990)

Processing High Volume Scan Test Results for Yield Learning. - Alfred L. Crouch; Phil Burlison; Dennis J. Ciplickas (ISQED, 2007)

A Tutorial on STDF Fail Datalog Standard. - Ajay Khoche; Phil Burlison; John Rowe; Glenn Plowman (ITC, 2008)