Boundary Scan: The ATE Vendors' View. - Phil Collins (ITC, 1988)

Expert System for the Functional Test Program Generation of Digital Electronic Circuit Boards. - Stephen M. Lea; Nigel Brown; Tim Katz; Phil Collins (ITC, 1988)

A Model-based Approach to Analog Fault Diagnosis using Techniques from Optimisation. - Salman Ahmed; Peter Y. K. Cheung; Phil Collins (EDAC-ETC-EUROASIC, 1994)