Built-in current testing-feasibility study. - Wojciech Maly; Phil Nigh (ICCAD, 1988)

Testing oriented analysis of CMOS ICs with opens. - Wojciech Maly; Pranab K. Nag; Phil Nigh (ICCAD, 1988)

Current sensing for built-in testing of CMOS circuits. - Derek B. I. Feltham; Phil Nigh; L. Richard Carley; Wojciech Maly (ICCD, 1988)

Layout-driven test generation. - Phil Nigh; Wojciech Maly (ICCAD, 1989)

Test Generation for Current Testing (CMOS ICs). - Phil Nigh; Wojciech Maly (IEEE Des. Test Comput., 1990)

ASIC Test Cost/Strategy Trade-offs. - Donald L. Wheater; Phil Nigh; Jeanne Trinko Mechler; Luke Lacroix (ITC, 1994)

Volume Manufacturing - ICs and Boards: DFT to the Rescue? - Robert C. Aitken; J. Hutcheson; N. Murthy; Phil Nigh; Nicholas Sporck (VTS, 1996)

Application and Analysis of IDDQ Diagnostic Software. - Phil Nigh; Donato O. Forlenza; Franco Motika (ITC, 1997)

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken; Wojciech Maly (ITC, 1997)

Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study. - Adit D. Singh; Phil Nigh; C. Mani Krishna 001 (ITC, 1997)

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. - Phil Nigh; Wayne M. Needham; Kenneth M. Butler; Peter C. Maxwell; Robert C. Aitken (VTS, 1997)

Binning for IC Quality: Experimental Studies on the SEMATECH Data. - Adit D. Singh; David R. Lakin II; Gaurav Sinha; Phil Nigh (DFT, 1998)

Diagnosis and characterization of timing-related defects by time-dependent light emission. - Daniel R. Knebel; Pia N. Sanda; Moyra K. McManus; Jeffrey A. Kash; James C. Tsang; David P. Vallett; Leendert M. Huisman; Phil Nigh; Rick Rizzolo; Peilin Song; Franco Motika (ITC, 1998)

SIA Roadmap: test must not limit future technologies. - Phil Nigh (ITC, 1998)

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. - Phil Nigh; David P. Vallett; Atul Patel; Jason Wright (ITC, 1998)

Best Methods for At-Speed Testing? - Peter C. Maxwell; Steve Baird; Wayne M. Needham; Al Crouch; Phil Nigh (VTS, 1998)

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment. - Phil Nigh; David P. Vallett; Atul Patel; Jason Wright; Franco Motika; Donato O. Forlenza; Ray Kurtulik; Wendy Chong (ITC, 1999)

Test method evaluation experiments and data. - Phil Nigh; Anne E. Gattiker (ITC, 2000)

MINVDD Testing for Weak CMOS ICs. - Chao-Wen Tseng; Ray Chen; Edward J. McCluskey; Phil Nigh (VTS, 2001)

Scan-Based Testing: The Only Practical Solution for Testing ASIC/Consumer Products. - Phil Nigh (ITC, 2002)

Debating the Future of Burn-In. - Edward J. McCluskey; Subhasish Mitra; Bob Madge; Peter C. Maxwell; Phil Nigh; Mike Rodgers (VTS, 2002)

The Increasing Importance of On-line Testing to Ensure High-Reliability Products. - Phil Nigh (ITC, 2003)

Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.. - Phil Nigh (ITC, 2004)

Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization". - Phil Nigh (ITC, 2004)

Random and Systematic Defect Analysis Using IDDQ Signature Analysis for Understanding Fails and Guiding Test Decisions. - Phil Nigh; Anne E. Gattiker (ITC, 2004)

Defect-Oriented Test for Ultra-Low DPM. - Vikram Iyengar; Phil Nigh (Asian Test Symposium, 2005)

Session Abstract. - Phil Nigh (VTS, 2006)

Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. - Phil Nigh (IEEE Des. Test Comput., 2006)

The Evolving Role of Test ... it is now a "Value Add" Operation. - Phil Nigh (DFT, 2008)

Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon. - Yen-Tzu Lin; Osei Poku; Ronald D. Blanton; Phil Nigh; Peter Lloyd; Vikram Iyengar (ITC, 2008)

How Many Test Patterns are Useless? - François-Fabien Ferhani; Nirmal R. Saxena; Edward J. McCluskey; Phil Nigh (VTS, 2008)

Application of non-parametric statistics of the parametric response for defect diagnosis. - Rama Gudavalli; W. Robert Daasch; Phil Nigh; Douglas Heaberlin (ITC, 2009)

Using well/substrate bias manipulation to enhance voltage-test-based defect detection. - Anne E. Gattiker; Phil Nigh (ITC, 2011)

Industry leaders panel - How will testing change in the next 10 years? - Phil Nigh (ITC, 2011)

How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond? - Phil Nigh (ITC, 2012)

Guest Editors' Introduction: Yield Learning Processes and Methods. - Anne E. Gattiker; Phil Nigh (IEEE Des. Test Comput., 2012)

Physically-Aware N-Detect Test. - Yen-Tzu Lin; Osei Poku; R. D. (Shawn) Blanton; Phil Nigh; Peter Lloyd; Vikram Iyengar (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Adaptive testing - Cost reduction through test pattern sampling. - Matt Grady; Bradley Pepper; Joshua Patch; Michael Degregorio; Phil Nigh (ITC, 2013)

Board manufacturing test correlation to IC manufacturing test. - C. Glenn Shirley; W. Robert Daasch; Phil Nigh; Zoe Conroy (ITC, 2014)

Testing in the year 2024 - big changes are coming. - Phil Nigh (ETS, 2016)