Alpha-particle-induced upsets in advanced CMOS circuits and technology. - David F. Heidel; Kenneth P. Rodbell; Ethan H. Cannon; Cyril Cabral Jr.; Michael S. Gordon; Phil Oldiges; Henry H. K. Tang (IBM J. Res. Dev., 2008)

Circuit design and modeling for soft errors. - A. J. KleinOsowski; Ethan H. Cannon; Phil Oldiges; Larry Wissel (IBM J. Res. Dev., 2008)

SOI FinFET soft error upset susceptibility and analysis. - Phil Oldiges; Kenneth P. Rodbell; Michael S. Gordon; John G. Massey; Kevin Stawiasz; Conal E. Murray; Henry H. K. Tang; K. Kim; K. Paul Muller (IRPS, 2015)

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction. - Rajiv V. Joshi; Keunwoo Kim; Rouwaida Kanj; Ajay N. Bhoj; Matthew M. Ziegler; Phil Oldiges; Pranita Kerber; Robert Wong; Terence Hook; Sudesh Saroop; Carl Radens; Chun-Chen Yeh (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Chip Power-Frequency Scaling in 10/7nm Node. - Phil Oldiges; Reinaldo A. Vega; Henry K. Utomo; Nick A. Lanzillo; Thomas Wassick; Juntao Li; Junli Wang; Ghavam G. Shahidi (IEEE Access, 2020)