Modeling of frequency and temperature effects in GaAs MESFETs. - Philip C. Canfield; Steven C. F. Lam; David J. Allstot (IEEE J. Solid State Circuits, 1990)

A p-well GaAs MESFET technology for mixed-mode applications. - Philip C. Canfield; David J. Allstot (IEEE J. Solid State Circuits, 1990)

Location of defective cells in HBT power amplifier arrays using IR emission microscopy. - Peter Dai; Philip C. Canfield (Microelectron. Reliab., 2001)