Application of electron and ion beam analysis techniques to microelectronics. - Tung-Sheng Kuan; Philip E. Batson; Randall M. Feenstra; Alan J. Slavin; Ruud M. Tromp (IBM J. Res. Dev., 1992)

Atomic resolution analytical microscopy. - Philip E. Batson (IBM J. Res. Dev., 2000)