Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. - Franc Brglez; Philip Pownall; Robert Hum (ITC, 1984)

Practical Application of Formal Verification Techniques on a Frame Mux/Demux Chip from Nortel Semiconductors. - Ying Xu; Eduard Cerny; Allan Silburt; A. Coady; Ying Liu; Philip Pownall (CHARME, 1999)