A Comparative Evaluation of Deep Learning Anomaly Detection Techniques on Semiconductor Multivariate Time Series Data. - Philip Tchatchoua; Guillaume Graton; Mustapha Ouladsine; Michel Juge (CASE, 2021)

1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing. - Philip Tchatchoua; Guillaume Graton; Mustapha Ouladsine; Julien Muller; Abraham Traoré; Michel Juge (ICCAD, 2022)

Ensemble Machine Learning Algorithms for Anomaly Detection in Multivariate Time-Series. - Youssef Trardi; Bouchra Ananou; Philip Tchatchoua; Mustapha Ouladsine (ICCAD, 2022)

Fault Detection on Variable Length Multivariate Time Series from Semiconductor Manufacturing. - Philip Tchatchoua; Guillaume Graton; Mustapha Ouladsine; Jean-François Christaud (SENSORS, 2023)

Application of 1D ResNet for Multivariate Fault Detection on Semiconductor Manufacturing Equipment. - Philip Tchatchoua; Guillaume Graton; Mustapha Ouladsine; Jean-François Christaud (Sensors, 2023)