Low power embedded DRAMs with high quality error correcting capabilities. - Philipp Öhler; Sybille Hellebrand (ETS, 2005)

Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. - Philipp Öhler; Sybille Hellebrand; Hans-Joachim Wunderlich (DDECS, 2007)

An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. - Philipp Öhler; Sybille Hellebrand; Hans-Joachim Wunderlich (ETS, 2007)

A Modular Memory BIST for Optimized Memory Repair. - Philipp Öhler; Alberto Bosio; Giorgio Di Natale; Sybille Hellebrand (IOLTS, 2008)