Erratum to "Improving the dynamic measurements of ADC's using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286]. - Philippe Cauvet (Comput. Stand. Interfaces, 2001)

Erratum to "Improving the dynamic measurements of ADCs using the 2-ADC method" [Computer standard and interfaces vol. 22 issue 4, 281-286]. - Philippe Cauvet (Comput. Stand. Interfaces, 2001)

A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. - Vincent Fresnaud; Lilian Bossuet; Dominique Dallet; Serge Bernard; Jean-Marie Janik; B. Agnus; Philippe Cauvet; Ph. Gandy (ETS, 2006)

A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (IEEE Des. Test Comput., 2006)

A First Step for an INL Spectral-Based BIST: The Memory Optimization. - Vincent Kerzerho; Serge Bernard; Philippe Cauvet; Jean-Marie Janik (J. Electron. Test., 2006)

System-in-Package, a Combination of Challenges and Solutions. - Philippe Cauvet; Serge Bernard; Michel Renovell (ETS, 2007)

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (ETS, 2007)

High throughput non-contact SiP testing. - Brian Moore 001; Chris Sellathamby; Philippe Cauvet; Hérvé Fleury; M. Paulson; Md. Mahbub Reja; Lin Fu; Brenda Bai; Edwin Walter Reid; Igor M. Filanovsky; Steven Slupsky (ITC, 2007)

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (IET Comput. Digit. Tech., 2007)

Diagnosis of assembly failures for System-in-Package RF tuners. - Erdem Serkan Erdogan; Sule Ozev; Philippe Cauvet (ISCAS, 2008)

Wireless Test Structure for Integrated Systems. - Ziad Noun; Philippe Cauvet; Marie-Lise Flottes; David Andreu 001; Serge Bernard (ITC, 2008)

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Michel Renovell; Mariane Comte; Omar Chakib (VLSI Design, 2008)

Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing. - Emmanuel Simeu; Hoang Nam Nguyen; Philippe Cauvet; Salvador Mir; Libor Rufer; Rafik Khereddine (VLSI Design, 2008)

A multi-converter DFT technique for complex SIP: Concepts and validation. - Vincent Kerzerho; Philippe Cauvet; Serge Bernard; Florence Azaïs; Mariane Comte; Michel Renovell (ECCTD, 2009)

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. - Vincent Kerzerho; Mariane Comte; Florence Azaïs; Philippe Cauvet; Serge Bernard; Michel Renovell (J. Electron. Test., 2011)

Solutions for the self-adaptation of communicating systems in operation. - Martin Andraud; Anthony Deluthault; Mouhamadou Dieng; Florence Azaïs; Serge Bernard; Philippe Cauvet; Mariane Comte; Thibault Kervaon; Vincent Kerzerho; Salvador Mir; Paul-Henri Pugliesi-Conti; Michel Renovell; et al. (IOLTS, 2014)

New Calibration Technique of Contact-less Resonant Biosensor. - Anthony Deluthault; Vincent Kerzerho; Serge Bernard; Fabien Soulier; Philippe Cauvet (J. Electron. Test., 2017)

Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device. - Anthony Deluthault; Luc Mezenge; Philippe Cauvet; Vincent Kerzerho; Fabien Soulier; Serge Bernard (J. Sensors, 2017)