Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols. - Philippe Chiquet; Pascal Masson; Romain Laffont; Gilles Micolau; Jérémy Postel-Pellerin; Frédéric Lalande; Bernard Bouteille; Jean-Luc Ogier (Microelectron. Reliab., 2012)

Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction. - Vincenzo Della Marca; Jérémy Postel-Pellerin; Thibault Kempf; Arnaud Régnier; Philippe Chiquet; Marc Bocquet (Microelectron. Reliab., 2018)