Embedded high-precision frequency-based capacitor measurement system. - Loic Welter; Philippe Dreux; Jean-Michel Portal; Hassen Aziza (IOLTS, 2013)

Accurate multiplexed test structure for threshold voltage matching evaluation. - Loic Welter; Philippe Dreux; Jordan Innocenti; Hassen Aziza; Jean-Michel Portal (DTIS, 2014)

An innovative standard cells remapping method for in-circuit critical parameters monitoring. - Loic Welter; Philippe Dreux; Hassen Aziza; Jean-Michel Portal (IOLTS, 2014)

Dynamic current reduction of CMOS digital circuits through design and process optimization. - Jordan Innocenti; Loïc Welter; Nicolas Borrel; Franck Julien; Jean-Michel Portal; Jacques Sonzogni; Laurent Lopez; Pascal Masson; Stephan Niel; Philippe Dreux; Julia Castellan (PATMOS, 2015)

Improvement of MOSFET matching characterization with calibrated multiplexed test structure. - Loic Welter; J. L. Scotto di Quaquero; Philippe Dreux; Laurent Lopez; Hassen Aziza; Jean-Michel Portal (Microelectron. Reliab., 2015)