Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. - Gerard Coquery; S. Carubelli; Jean-Pierre Ousten; Richard Lallemand; Frederic Lecoq; Dominique Lhotellier; V. de Viry; Philippe Dupuy (Microelectron. Reliab., 2001)

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. - B. Khong; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Marc Legros; A. Deram; Colette Levade; G. Vanderschaeve; Jean-Marie Dorkel; Jean-Pierre Fradin (Microelectron. Reliab., 2005)

Characterization and modelling of ageing failures on power MOSFET devices. - B. Khong; Marc Legros; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Colette Levade; G. Vanderschaeve; Emmanuel Scheid (Microelectron. Reliab., 2007)

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade; G. Vanderschaeve (Microelectron. Reliab., 2009)

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. - Donatien Martineau; Thomas Mazeaud; Marc Legros; Philippe Dupuy; Colette Levade (Microelectron. Reliab., 2010)

3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. - Toufik Azoui; Patrick Tounsi; Philippe Dupuy; L. Guillot; Jean-Marie Dorkel (Microelectron. Reliab., 2011)

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. - Gilles Rostaing; Mounira Berkani; D. Mechouche; Denis Labrousse; Stéphane Lefebvre; Zoubir Khatir; Philippe Dupuy (Microelectron. Reliab., 2013)

Universal mechanisms of Al metallization ageing in power MOSFET devices. - Donatien Martineau; Colette Levade; Marc Legros; Philippe Dupuy; Thomas Mazeaud (Microelectron. Reliab., 2014)

3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. - Michele Riccio; Vincenzo d'Alessandro; Andrea Irace; Gilles Rostaing; Mounira Berkani; Stéphane Lefebvre; Philippe Dupuy (Microelectron. Reliab., 2014)

In-depth investigation of metallization aging in power MOSFETs. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2015)

Mechanisms of power module source metal degradation during electro-thermal aging. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2017)