The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. - Christelle Delage; Nicolas Nolhier; Marise Bafleur; Jean-Marie Dorkel; Jo Hamid; Philippe Givelin; Jacques Lin-Kwang (IEEE J. Solid State Circuits, 1999)

Determination of the ESD Failure Cause Through its Signature. - M. Zecri; P. Besse; Philippe Givelin; M. Nayrolles; Marise Bafleur; Nicolas Nolhier (Microelectron. Reliab., 2003)