Mechanical and chemical adhesion at the encapsulant interfaces in laminated photovoltaic modules. - Philippe Nivelle; Tom Borgers; Eszter Voroshazi; Jef Poortmans; Jan D'Haen; Ward De Ceuninck; Michael Daenen (IRPS, 2018)

Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications. - Gilles Oudebrouckx; Thijs Vandenryt; Philippe Nivelle; Seppe Bormans; Patrick H. Wagner; Ronald Thoelen (IEEE Trans. Instrum. Meas., 2021)