Estimating the Single-Event Upset sensitivity of a memory array using simulation. - Mélanie Raine; Marc Gaillardin; Thierry Lagutere; Olivier Duhamel; Philippe Paillet (Microelectron. Reliab., 2017)

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. - Calvin Yi-Ping Chao; Shang-Fu Yeh; Meng-Hsu Wu; Kuo-Yu Chou; Honyih Tu; Chih-Lin Lee; Chin Yin; Philippe Paillet; Vincent Goiffon (Sensors, 2019)

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. - Alexandre Le Roch; Vincent Goiffon; Olivier Marcelot; Philippe Paillet; Federico Pace; Jean-Marc Belloir; Pierre Magnan; Cédric Virmontois (Sensors, 2019)

Atmospheric Neutron Monitoring through Optical Fiber-Based Sensing. - Sylvain Girard; Adriana Morana; Cornelia Hoehr; Michael Trinczek; Jeoffray Vidalot; Philippe Paillet; Camille Bélanger-Champagne; Julien Mekki; Nicolas Balcon; Gaetano Li Vecchi; Cosimo Campanella; Damien Lambert; et al. (Sensors, 2020)

Extreme Radiation Sensitivity of Ultra-Low Loss Pure-Silica-Core Optical Fibers at Low Dose Levels and Infrared Wavelengths. - Adriana Morana; Cosimo Campanella; Jeoffray Vidalot; Vincenzo De Michele; Emmanuel Marin; Imène Reghioua; Aziz Boukenter; Youcef Ouerdane; Philippe Paillet; Sylvain Girard (Sensors, 2020)

Monitoring of Ultra-High Dose Rate Pulsed X-ray Facilities with Radioluminescent Nitrogen-Doped Optical Fiber. - Jeoffray Vidalot; Cosimo Campanella; Julien Dachicourt; Claude Marcandella; Olivier Duhamel; Adriana Morana; David Poujols; Gilles Assaillit; Marc Gaillardin; Aziz Boukenter; Youcef Ouerdane; Sylvain Girard; et al. (Sensors, 2022)