Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. - Géraldine Bertrand; Christelle Delage; Marise Bafleur; Nicolas Nolhier; Jean-Marie Dorkel; Quang Nguyen; Nicolas Mauran; David Trémouilles; Philippe Perdu (IEEE J. Solid State Circuits, 2001)

Modeling Thermal Laser Stimulation. - Felix Beaudoin; X. Chauffleur; Jean-Pierre Fradin; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2001)

Silicon Thinning and Polishing on Packaged Devices. - Felix Beaudoin; Philippe Perdu; Romain Desplats; Sebastien Rigo; Dean Lewis (Microelectron. Reliab., 2001)

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Patrick Poirier; David Trémouilles; Marise Bafleur; Dean Lewis (Microelectron. Reliab., 2001)

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. - Romain Desplats; Philippe Perdu; Felix Beaudoin (Microelectron. Reliab., 2001)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. - Felix Beaudoin; D. Carisetti; Romain Desplats; Philippe Perdu; Dean Lewis; J. C. Clement (Microelectron. Reliab., 2002)

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

Magnetic field measurements for Non Destructive Failure Analysis. - Olivier Crépel; C. Goupil; Bernadette Domengès; Philippe Descamps; Philippe Perdu; A. Doukkali (Microelectron. Reliab., 2002)

IR confocal laser microscopy for MEMS Technological Evaluation. - Djemel Lellouchi; Felix Beaudoin; Christophe Le Touze; Philippe Perdu; Romain Desplats (Microelectron. Reliab., 2002)

Fault Localization using Time Resolved Photon Emission and STIL Waveforms. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Nagamani Nataraj; Ted R. Lundquist; Ketan Shah (ITC, 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

A physical approach on SCOBIC investigation in VLSI. - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). - Thomas Beauchêne; David Trémouilles; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2003)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Magnetic emission mapping for passive integrated components characterisation. - Olivier Crépel; Romain Desplats; Y. Bouttement; Philippe Perdu; C. Goupil; Philippe Descamps; Felix Beaudoin; L. Marina (Microelectron. Reliab., 2003)

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. - Romain Desplats; A. Eral; Felix Beaudoin; Philippe Perdu; Alan J. Weger; Moyra K. McManus; Peilin Song; Franco Stellari (Microelectron. Reliab., 2003)

Short defect characterization based on TCR parameter extraction. - Abdellatif Firiti; D. Faujour; Gérald Haller; J. M. Moragues; Vincent Goubier; Philippe Perdu; Felix Beaudoin; Dean Lewis (Microelectron. Reliab., 2003)

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. - Mustapha Remmach; Romain Desplats; Felix Beaudoin; E. Frances; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2003)

Solar Cell Analysis with Light Emission and OBIC Techniques. - Kevin Sanchez; Romain Desplats; Guy Perez; V. Pichetto; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2003)

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)

Femtosecond Laser Ablation for Backside Silicon Thinning. - Felix Beaudoin; J. López; M. Faucon; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2004)

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. - Olivier Crépel; Patrick Poirier; Philippe Descamps; Romain Desplats; Philippe Perdu; Gérald Haller; Abdellatif Firiti (Microelectron. Reliab., 2004)

Time Resolved Photon Emission Processing Flow for IC Analysis. - Romain Desplats; Gaël Faggion; Mustapha Remmach; Felix Beaudoin; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2004)

Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? - Mustapha Remmach; Romain Desplats; Philippe Perdu; J. P. Roux; Michel Vallet; Sylvain Dudit; P. Sardin; Dean Lewis (Microelectron. Reliab., 2004)

Implementation of TRE systems into Emission Microscopes. - Alberto Tosi; Mustapha Remmach; Romain Desplats; Franco Zappa; Philippe Perdu (Microelectron. Reliab., 2004)

Electrical Modeling for Laser Testing with Different Pulse Durations. - Alexandre Douin; Vincent Pouget; Dean Lewis; Pascal Fouillat; Philippe Perdu (IOLTS, 2005)

Dynamic Laser Stimulation Case Studies. - Felix Beaudoin; Kevin Sanchez; Romain Desplats; Philippe Perdu; Jean Marc Nicot; J. P. Roux; M. Otte (Microelectron. Reliab., 2005)

Failure analysis of micro-heating elements suspended on thin membranes. - Danick Briand; Felix Beaudoin; Jérôme Courbat; Nico F. de Rooij; Romain Desplats; Philippe Perdu (Microelectron. Reliab., 2005)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Oxide charge measurements in EEPROM devices. - C. De Nardi; Romain Desplats; Philippe Perdu; Felix Beaudoin; J.-L. Gauffier (Microelectron. Reliab., 2005)

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. - Mustapha Remmach; A. Pigozzi; Romain Desplats; Philippe Perdu; Dean Lewis; J. Noel; Sylvain Dudit (Microelectron. Reliab., 2005)

NIR laser stimulation for dynamic timing analysis. - Kevin Sanchez; Romain Desplats; Felix Beaudoin; Philippe Perdu; J. P. Roux; G. Woods; Dean Lewis (Microelectron. Reliab., 2005)

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. - Christophe De Nardi; Romain Desplats; Philippe Perdu; Jean-Luc Gauffier; Christophe Guérin (Microelectron. Reliab., 2006)

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. - Alexandre Douin; Vincent Pouget; M. De Matos; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2006)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Identification of process/design issues during 0.18 µm technology qualification for space application. - Julie Ferrigno; Philippe Perdu; Kevin Sanchez; Dean Lewis (DATE, 2007)

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. - Felix Beaudoin; Kevin Sanchez; Philippe Perdu (Microelectron. Reliab., 2007)

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. - Mohsine Bouya; D. Carisetti; Nathalie Malbert; Nathalie Labat; Philippe Perdu; J. C. Clement; M. Bonnet; G. Pataut (Microelectron. Reliab., 2007)

Long-term reliability of silicon bipolar transistors subjected to low constraints. - A. Crosson; Laurent Escotte; Marise Bafleur; D. Talbourdet; L. Crétinon; Philippe Perdu; Guy Perez (Microelectron. Reliab., 2007)

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. - Mohsine Bouya; Nathalie Malbert; Nathalie Labat; D. Carisetti; Philippe Perdu; J. C. Clement; Benoit Lambert; M. Bonnet (Microelectron. Reliab., 2008)

Generic simulator for faulty IC. - Julie Ferrigno; Aziz Machouat; Philippe Perdu; Dean Lewis; Gérald Haller; Vincent Goubier (Microelectron. Reliab., 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

Dynamic study of the thermal laser stimulation response on advanced technology structures. - Antoine Reverdy; M. de la Bardonnie; Patrick Poirier; H. Murray; Philippe Perdu; A. Boukkali (Microelectron. Reliab., 2008)

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. - Antoine Reverdy; Philippe Perdu; H. Murray; M. de la Bardonnie; Patrick Poirier (Microelectron. Reliab., 2008)

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. - Magdalena Sienkiewicz; Philippe Perdu; Abdellatif Firiti; Kevin Sanchez; Olivier Crépel; Dean Lewis (Microelectron. Reliab., 2008)

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2009)

Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. - F. Molière; B. Foucher; Philippe Perdu; Alain Bravaix (Microelectron. Reliab., 2009)

When Failure Analysis Meets Side-Channel Attacks. - Jerome Di-Battista; Jean-Christophe Courrège; Bruno Rouzeyre; Lionel Torres; Philippe Perdu (CHES, 2010)

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

CADless laser assisted methodologies for failure analysis and device reliability. - A. Deyine; Kevin Sanchez; Philippe Perdu; F. Battistella; Dean Lewis (Microelectron. Reliab., 2010)

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. - Fulvio Infante; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2010)

VLSI functional analysis by dynamic emission microscopy. - Philippe Perdu; Jerome Di-Battista; Sylvain Dudit; Tomonori Nakamura (Microelectron. Reliab., 2010)

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. - Guillaume Bascoul; Philippe Perdu; A. Benigni; Sylvain Dudit; Guillaume Celi; Dean Lewis (Microelectron. Reliab., 2011)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2011)

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. - Fulvio Infante; Philippe Perdu; H. B. Kor; Chee Lip Gan; Dean Lewis (Microelectron. Reliab., 2011)

High performance thermography with InGaAs photon counting camera. - Guillaume Bascoul; Philippe Perdu; Maryse Béguin; Dean Lewis (Microelectron. Reliab., 2012)

Optimum Si thickness for backside detection of photon emission using Si-CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu (Microelectron. Reliab., 2012)

Frequency mapping in dynamic light emission with wavelet transform. - Samuel Chef; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2013)

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. - I. El Moukhtari; Vincent Pouget; C. Larue; Frédéric Darracq; Dean Lewis; Philippe Perdu (Microelectron. Reliab., 2013)

Pattern image enhancement by extended depth of field. - Samuel Chef; Bastien Billiot; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2014)

Backside spectroscopic photon emission microscopy using intensified silicon CCD. - Arkadiusz Glowacki; Christian Boit; Philippe Perdu; Yoshitaka Iwaki (Microelectron. Reliab., 2014)

A comprehensive study of the application of the EOP techniques on bipolar devices. - Mohamed Mehdi Rebaï; Frédéric Darracq; Jean-Paul Guillet; Elise Bernou; Kevin Sanchez; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2014)

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. - Samuel Chef; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (J. Electronic Imaging, 2015)

Editorial. - Marise Bafleur; Philippe Perdu; François Marc; Hélène Frémont; Nicolas Nolhier (Microelectron. Reliab., 2015)

Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2015)

Unsupervised learning for signal mapping in dynamic photon emission. - Samuel Chef; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak; Chee Lip Gan (Microelectron. Reliab., 2015)

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization. - Nicolas Courjault; Philippe Perdu; Fulvio Infante; Thierry Lebey; Vincent Bley (Microelectron. Reliab., 2015)

A way to implement the electro-optical technique to inertial MEMS. - Kevin Melendez; A. Desmoulin; Kevin Sanchez; Philippe Perdu; Dean Lewis (Microelectron. Reliab., 2015)

Automatic process for time-frequency scan of VLSI. - Anthony Boscaro; Sabir Jacquir; Kevin Melendez; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2016)

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. - Chung Tah Chua; Hock Guan Ong; Kevin Sanchez; Philippe Perdu; Chee Lip Gan (Microelectron. Reliab., 2016)

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (FUSION, 2017)

Pattern image enhancement by automatic focus correction. - Anthony Boscaro; Sabir Jacquir; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Microelectron. Reliab., 2017)

Automatic localization of signal sources in photon emission images for integrated circuit analysis. - Anthony Boscaro; Sabir Jacquir; Samuel Chef; Kevin Sanchez; Philippe Perdu; Stéphane Binczak (Signal Image Video Process., 2018)