Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration. - Mayssam Jannoun; Younes Aoues; Emmanuel Pagnacco; Philippe Pougnet; Abdelkhalak El Hami (Microelectron. Reliab., 2017)

Power module thermal cycling tester for in-situ ageing detection. - Philippe Pougnet; Gerard Coquery; Richard Lallemand; A. Makhloufi (Microelectron. Reliab., 2017)