Editing First-Order Proofs: Programmed Rules vs Derived Rules. - Maria-Virginia Aponte; José Alberto Fernández; Philippe Roussel (SLP, 1984)

The Birth of Prolog. - Alain Colmerauer; Philippe Roussel (HOPL Preprints, 1993)

Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. - Yunlong Li; Zsolt Tökei; Philippe Roussel; Guido Groeseneken; Karen Maex (Microelectron. Reliab., 2005)

Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations. - Antonis Papanikolaou; T. Grabner; Miguel Miranda; Philippe Roussel; Francky Catthoor (CODES+ISSS, 2006)

Estimation des titres viraux : une programmation pratique et fiable sur calculatrice de poche, et accessible par l'Internet. - Jocelyne Husson van Vliet; Philippe Roussel (Monde des Util. Anal. Données, 2006)

Distribution and generation of traps in SiO2/Al2O3 gate stacks. - Isodiana Crupi; Robin Degraeve; Bogdan Govoreanu; David P. Brunco; Philippe Roussel; Jan Van Houdt (Microelectron. Reliab., 2007)

Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. - Ben Kaczer; Robin Degraeve; Philippe Roussel; Guido Groeseneken (Microelectron. Reliab., 2007)

Transient voltage overshoot in TLP testing - Real or artifact? - David Trémouilles; Steven Thijs; Philippe Roussel; M. I. Natarajan; Vesselin K. Vassilev; Guido Groeseneken (Microelectron. Reliab., 2007)

Variability aware modeling of SoCs: From device variations to manufactured system yield. - Miguel Miranda; Bart Dierickx; Paul Zuber; Petr Dobrovolný; F. Kutscherauer; Philippe Roussel; Pavel Poliakov (ISQED, 2009)

Exponent Monte Carlo for Quick Statistical Circuit Simulation. - Paul Zuber; Vladimir Matvejev; Philippe Roussel; Petr Dobrovolný; Miguel Miranda (PATMOS, 2009)

Qualitative modelling of a multi-step process: The case of French breadmaking. - Amadou Ndiaye; Guy Della Valle; Philippe Roussel (Expert Syst. Appl., 2009)

On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. - Jouke Verbree; Erik Jan Marinissen; Philippe Roussel; Dimitrios Velenis (ETS, 2010)

Statistical characterization of standard cells using design of experiments with response surface modeling. - Miguel Miranda; Philippe Roussel; Lucas Brusamarello; Gilson I. Wirth (DAC, 2011)

Variability aware modeling for yield enhancement of SRAM and logic. - Miguel Miranda; Paul Zuber; Petr Dobrovolný; Philippe Roussel (DATE, 2011)

Fast and accurate statistical characterization of standard cell libraries. - Lucas Brusamarello; Gilson I. Wirth; Philippe Roussel; Miguel Miranda (Microelectron. Reliab., 2011)

Defect-centric perspective of time-dependent BTI variability. - Maria Toledano-Luque; Ben Kaczer; Jacopo Franco; Philippe Roussel; Tibor Grasser; Guido Groeseneken (Microelectron. Reliab., 2012)

Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies. - Trong Huynh Bao; Dmitry Yakimets; Julien Ryckaert; Ivan Ciofi; Rogier Baert; Anabela Veloso; Jürgen Bömmels; Nadine Collaert; Philippe Roussel; S. Demuynck; Praveen Raghavan; Abdelkarim Mercha; et al. (ESSDERC, 2014)

Characterization and simulation methodology for time-dependent variability in advanced technologies. - Pieter Weckx; Ben Kaczer; Praveen Raghavan; Jacopo Franco; Marko Simicic; Philippe J. Roussel; Dimitri Linten; Aaron Thean; Diederik Verkest; Francky Catthoor; Guido Groeseneken (CICC, 2015)

The defect-centric perspective of device and circuit reliability - From individual defects to circuits. - Ben Kaczer; Jacopo Franco; Pieter Weckx; Philippe Roussel; Erik Bury; Moonju Cho; Robin Degraeve; Dimitri Linten; Guido Groeseneken; Halil Kukner; Praveen Raghavan; Francky Catthoor; et al. (ESSDERC, 2015)

Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology. - Pieter Weckx; Ben Kaczer; Philippe J. Roussel; Francky Catthoor; Guido Groeseneken (ICICDT, 2015)

Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. - Simon Van Beek; Koen Martens; Philippe Roussel; Gabriele Luca Donadio; Johan Swerts; Sofie Mertens; Gouri Sankar Kar; Tai Min; Guido Groeseneken (IRPS, 2015)

Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI. - Ankush Chaudhary; Ben Kaczer; Philippe J. Roussel; Thomas Chiarella; Naoto Horiguchi; Souvik Mahapatra (IRPS, 2015)

NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures. - Jacopo Franco; Ben Kaczer; Philippe J. Roussel; Erik Bury; Hans Mertens; Romain Ritzenthaler; Tibor Grasser; Naoto Horiguchi; Aaron Thean; Guido Groeseneken (IRPS, 2015)

Origins and implications of increased channel hot carrier variability in nFinFETs. - Ben Kaczer; Jacopo Franco; M. Cho; Tibor Grasser; Philippe J. Roussel; Stanislav Tyaginov; M. Bina; Yannick Wimmer; Luis-Miguel Procel; Lionel Trojman; Felice Crupi; Gregory Pitner; et al. (IRPS, 2015)

The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. - Abhitosh Vais; Koen Martens; Jacopo Franco; Dennis Lin; AliReza Alian; Philippe Roussel; S. Sioncke; Nadine Collaert; Aaron Thean; Marc M. Heyns; Guido Groeseneken; Kristin De Meyer (IRPS, 2015)

Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology. - Pieter Weckx; Ben Kaczer; C. Chen; Jacopo Franco; Erik Bury; Kausik Chanda; J. Watt; Philippe J. Roussel; Francky Catthoor; Guido Groeseneken (IRPS, 2015)

Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point. - Dimitrios Rodopoulos; Philippe Roussel; Francky Catthoor; Yiannakis Sazeides; Dimitrios Soudris (ERMAVSS@DATE, 2016)

LER and spacing variability on BEOL TDDB using E-field mapping: Impact of field acceleration. - Deniz Kocaay; Philippe Roussel; Kris Croes; Ivan Ciofi; Yves Saad; Ingrid De Wolf (Microelectron. Reliab., 2017)

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. - Simon Van Beek; Philippe Roussel; Barry J. O'Sullivan; Robin Degraeve; Stefan Cosemans; Dimitri Linten; Gouri Sankar Kar (ESSDERC, 2018)

Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications. - Jonas Doevenspeck; Robin Degraeve; Stefan Cosemans; Philippe Roussel; Bram-Ernst Verhoef; Rudy Lauwereins; Wim Dehaene (ESSDERC, 2018)

Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing. - Deniz Kocaay; Philippe Roussel; Kristof Croes; Ivan Ciofi; Alicja Lesniewska; Ingrid De Wolf (IRPS, 2018)

Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. - Barry J. O'Sullivan; Simon Van Beek; Philippe J. Roussel; Sidharth Rao; Wonsub Kim; S. Couet; Johan Swerts; Farrukh Yasin; Dimitri Crotti; Dimitri Linten; Gouri Sankar Kar (IRPS, 2018)

New methodology for modelling MOL TDDB coping with variability. - Philippe J. Roussel; Adrian Vaisman Chasin; Steven Demuynck; Naoto Horiguchi; Dimitri Linten; Anda Mocuta (IRPS, 2018)

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. - Ben Kaczer; Jacopo Franco; Pieter Weckx; Philippe Roussel; Vamsi Putcha; Erik Bury; Marko Simicic; Adrian Vaisman Chasin; Dimitri Linten; Bertrand Parvais; Francky Catthoor; Gerhard Rzepa; et al. (Microelectron. Reliab., 2018)

Comphy - A compact-physics framework for unified modeling of BTI. - Gerhard Rzepa; Jacopo Franco; Barry J. O'Sullivan; A. Subirats; Marko Simicic; Geert Hellings; Pieter Weckx; Markus Jech; Theresia Knobloch; Michael Waltl; Philippe Roussel; Dimitri Linten; et al. (Microelectron. Reliab., 2018)

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants. - Alexander Makarov; Dimitri Linten; Stanislav Tyaginov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Markus Jech; Tibor Grasser (ESSDERC, 2019)

Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP. - Geert Hellings; Philippe Roussel; Nian Wang 004; Roman Boschke; Shih-Hung Chen; Marko Simicic; Mirko Scholz; Soeren Stoedel; Kris Myny; Dimitri Linten; Paul Hellings; Nowab Reza M. D. Ashif (IRPS, 2019)

Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. - Alexander Makarov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Alexander Grill; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Tibor Grasser; Dimitri Linten; Stanislav Tyaginov (IRPS, 2019)

Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling. - Zhicheng Wu; Jacopo Franco; Dieter Claes; Gerhard Rzepa; Philippe J. Roussel; Nadine Collaert; Guido Groeseneken; Dimitri Linten; Tibor Grasser; Ben Kaczer (IRPS, 2019)

Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations. - Marko Simicic; Pieter Weckx; Bertrand Parvais; Philippe Roussel; Ben Kaczer; Georges G. E. Gielen (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill. - Alicja Lesniewska; Philippe J. Roussel; Davide Tierno; Victor Vega-Gonzalez; Marleen H. van der Veen; Patrick Verdonck; Nicolas Jourdan 002; Christopher J. Wilson; Zsolt Tökei; Kris Croes (IRPS, 2020)

Physics-based device aging modelling framework for accurate circuit reliability assessment. - Zhicheng Wu; Jacopo Franco; Brecht Truijen; Philippe Roussel; Stanislav Tyaginov; Michiel Vandemaele; Erik Bury; Guido Groeseneken; Dimitri Linten; Ben Kaczer (IRPS, 2021)

Assessment of critical Co electromigration parameters. - O. Varela Pedreira; Melina Lofrano; Houman Zahedmanesh; Philippe J. Roussel; Marleen H. van der Veen; Veerle Simons; Emmanuel Chery; Ivan Ciofi; Kris Croes (IRPS, 2022)

Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. - Brecht Truijen; Barry J. O'Sullivan; Md. Nurul Alam; Dieter Claes; Mischa Thesberg; Philippe Roussel; Adrian Vaisman Chasin; Geert Van den Bosch; Ben Kaczer; Jan Van Houdt (IRPS, 2022)

Degradation mechanisms in Germanium Electro-Absorption Modulators. - Artemisia Tsiara; Alicja Lesniewska; Philippe Roussel; Srinivasan Ashwyn Srinivasan; Mathias Berciano; Marko Simicic; Marianna Pantouvaki; Joris Van Campenhout; Kristof Croes (IRPS, 2022)

Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks. - Andrea Vici; Robin Degraeve; João Pedro Bastos; Philippe Roussel; Ingrid De Wolf (IRPS, 2022)

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. - Kristof Croes; Veerle Simons; Brecht Truijen; Philippe Roussel; Koen Van Sever; Artemisia Tsiara; Jacopo Franco; Philippe Absil (OFC, 2022)

Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET and nFET from simultaneous PV and IV measurements. - Md Nur K. Alam; Yusuke Higashi; Brecht Truijen; Ben Kaczer; Mihaela Ioana Popovici; Bj O'Sullivan; Philippe Roussel; Robin Degraeve; Marc M. Heyns; Jan Van Houdt (VLSI Technology and Circuits, 2022)

Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations. - Andrea Vici; Robin Degraeve; Philippe J. Roussel; Jacopo Franco; Ben Kaczer; Ingrid De Wolf (IRPS, 2023)

A pragmatic network-aware paradigm for system-level electromigration predictions at scale. - Houman Zahedmanesh; Philippe Roussel; Ivan Ciofi; Kristof Croes (IRPS, 2023)

Silent Data Corruption: Test or Reliability Problem? - Erik Jan Marinissen; Harish Dattatraya Dixit; Ronald Shawn Blanton; Aaron Kuo; Wei Li; Subhasish Mitra; Chris Nigh; Ruben Purdy; Ben Kaczer; Dishant Sangani; Pieter Weckx; Philippe J. Roussel; et al. (ETS, 2024)

Reducing Reservoir Dimensionality with Phase Space Construction for Simplified Hardware Implementation. - Yuanyang Guo; Robin Degraeve; Philippe Roussel; Ben Kaczer; Erik Bury; Ingrid Verbauwhede (ICANN (10), 2024)

BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure. - Y. Fang; Alicja Lesniewska; Ivan Ciofi; Philippe Roussel; Chen Wu; Victor Vega-Gonzalez; Ingrid De Wolf; Kris Croes (IRPS, 2024)

De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure. - O. Varela Pedreira; Youqi Ding; D. Coenen; Philippe Roussel; Ahmed Sobhi Saleh; Veerle Simons; Houman Zahedmanesh; Ivan Ciofi; Kris Croes (IRPS, 2024)

Possible Origins, Identification, and Screening of Silent Data Corruption in Data Centers. - Dishant Sangani; Ben Kaczer; Pieter Weckx; Philippe J. Roussel; Subrat Mishra; Erik Jan Marinissen; Georges G. E. Gielen (IRPS, 2024)

Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current. - Anirudh Varanasi; Robin Degraeve; Philippe J. Roussel; Andrea Vici; Clement Merckling (IRPS, 2024)

Transition-state-theory-based interpretation of Landau double well potential for ferroelectrics. - Md Nur K. Alam; Sergiu Clima; Ben Kaczer; Philippe Roussel; Brecht Truijen; Lars-Åke Ragnarsson; N. Horiguchi; Marc M. Heyns; Jan Van Houdt (CoRR, 2024)

Local Electric Field-Aware 3D TDDB Model for BEOL Reliability Predictions. - Y. Fang; Alicja Lesniewska; Ivan Ciofi; Philippe Roussel; I. De Wolf; Kris Croes (IRPS, 2025)

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. - Yusuke Higashi; Anirudh Varanasi; Philippe J. Roussel; Pablo Saraza-Canflanca; J. P. Bastos; Alexander Grill; E. Catapano; R. Asanovski; Jacopo Franco; Ben Kaczer; Adrian Chasin; Devin Verreck; et al. (IRPS, 2025)

Leakage and TDDB Mechanisms in 18 nm Pitch Direct Metal Etch Ru Interconnects with Airgaps. - Alicja Lesniewska; Y. Fang; G. Delie; Philippe Roussel; Koen Van Sever; Emmanuel Chery; O. Varela Pedreira; Ivan Ciofi; S. H. Park; Zsolt Tokei; Kris Croes (IRPS, 2025)

Algorithm for Robust Correction of Long-Term Drift Components in Gate Leakage Current RTN Data. - Anirudh Varanasi; Robin Degraeve; Philippe J. Roussel; Clement Merckling (IRPS, 2025)

RTNinja: a generalized machine learning framework for analyzing random telegraph noise signals in nanoelectronic devices. - Anirudh Varanasi; Robin Degraeve; Philippe Roussel; Clement Merckling (CoRR, 2025)