Logic characterization vehicle design reflection via layout rewiring. - Phillip Fynan; Zeye Liu 001; Benjamin Niewenhuis; Soumya Mittal; Marcin Strajwas; R. D. (Shawn) Blanton (ITC, 2016)

Front-end layout reflection for test chip design. - Zeye Liu 001; Phillip Fynan; Ronald D. Blanton (ITC, 2017)