Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability. - Wei Hwang; George Diedrich Gristede; Pia N. Sanda; Shao Y. Wang; David F. Heidel (CICC, 1998)

Diagnosis and characterization of timing-related defects by time-dependent light emission. - Daniel R. Knebel; Pia N. Sanda; Moyra K. McManus; Jeffrey A. Kash; James C. Tsang; David P. Vallett; Leendert M. Huisman; Phil Nigh; Rick Rizzolo; Peilin Song; Franco Motika (ITC, 1998)

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). - William V. Huott; Moyra K. McManus; Daniel R. Knebel; Steve Steen; Dennis Manzer; Pia N. Sanda; Steven C. Wilson; Yuen H. Chan; Antonio Pelella; Stanislav Polonsky (ITC, 1999)

Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability. - Wei Hwang; George Diedrich Gristede; Pia N. Sanda; Shao Y. Wang; David F. Heidel (IEEE J. Solid State Circuits, 1999)

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis. - Stanislav Polonsky; Moyra K. McManus; Daniel R. Knebel; Steve Steen; Pia N. Sanda (Asian Test Symposium, 2000)

Optical and Electrical Testing of Latchup in I/O Interface Circuits. - Franco Stellari; Peilin Song; Moyra K. McManus; Robert Gauthier 002; Alan J. Weger; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda (ITC, 2003)

Latchup Analysis Using Emission Microscopy. - Franco Stellari; Peilin Song; Moyra K. McManus; Alan J. Weger; Robert Gauthier 002; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda; Philip Wu; Steven C. Wilson (Microelectron. Reliab., 2003)

The concern for soft errors is not overblown. - Pia N. Sanda (ITC, 2005)

Guest Editors' Introduction: Reliability-Aware Microarchitecture. - Sarita V. Adve; Pia N. Sanda (IEEE Micro, 2005)

Soft Errors: Technology Trends, System Effects, and Protection Techniques. - Subhasish Mitra; Pia N. Sanda; Norbert Seifert (IOLTS, 2007)

Soft Errors: System Effects, Protection Techniques and Case Studies. - Dimitris Gizopoulos; Kaushik Roy 001; Subhasish Mitra; Pia N. Sanda (DATE, 2008)

Statistical Fault Injection. - Pradeep Ramachandran; Prabhakar Kudva; Jeffrey W. Kellington; John Schumann; Pia N. Sanda (DSN, 2008)

Soft-error resilience of the IBM POWER6 processor input/output subsystem. - Carl A. Bender; Pia N. Sanda; Prabhakar Kudva; Ricardo Mata; Vikas Pokala; Ryan Haraden; Matthew Schallhorn (IBM J. Res. Dev., 2008)

Phaser: Phased methodology for modeling the system-level effects of soft errors. - Jude A. Rivers; Pradip Bose; Prabhakar Kudva; John-David Wellman; Pia N. Sanda; Ethan H. Cannon; Luiz C. Alves (IBM J. Res. Dev., 2008)

Soft-error resilience of the IBM POWER6 processor. - Pia N. Sanda; Jeffrey W. Kellington; Prabhakar Kudva; Ronald N. Kalla; Ryan B. McBeth; Jerry Ackaret; Ryan Lockwood; John Schumann; Christopher R. Jones (IBM J. Res. Dev., 2008)

Fault-Tolerant Design of the IBM Power6 Microprocessor. - Kevin Reick; Pia N. Sanda; Scott B. Swaney; Jeffrey W. Kellington; Michael J. Mack; Michael S. Floyd; Daniel Henderson (IEEE Micro, 2008)

Cross-layer resilience challenges: Metrics and optimization. - Subhasish Mitra; Kevin Brelsford; Pia N. Sanda (DATE, 2010)