Aliasing errors in signature analysis testing of integrated circuits. - Maurizio Damiani; Piero Olivo; Michele Favalli; Bruno Riccò (ICCD, 1988)

Improved testability evaluations in combinational logic networks. - Silvia Ercolani; Michele Favalli; Maurizio Damiani; Piero Olivo; Bruno Riccò (ICCD, 1989)

CMOS Design for Improved IC Testability. - Michele Favalli; Piero Olivo; Maurizio Damiani; Bruno Riccò (ITC, 1989)

A Testing Technique to Characterize E^2PROM's Aging and Endurance. - Massimo Lanzoni; Piero Olivo; Bruno Riccò (ITC, 1989)

On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing. - Piero Olivo; Maurizio Damiani; Bruno Riccò (ITC, 1989)

An analytical model for the aliasing probability in signature analysis testing. - Maurizio Damiani; Piero Olivo; Michele Favalli; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

Testing of E2PROM aging and endurance: A case study. - Massimo Lanzoni; Roberto Menozzi; Piero Olivo; Bruno Riccò; Andrea Haardt (Eur. Trans. Telecommun., 1990)

Aliasing in signature analysis testing with multiple input shift registers. - Maurizio Damiani; Piero Olivo; Michele Favalli; Silvia Ercolani; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Novel design for testability schemes for CMOS ICs. - Michele Favalli; Piero Olivo; Maurizio Damiani; Bruno Riccò (IEEE J. Solid State Circuits, 1990)

Detection of PLA multiple crosspoint faults. - M. Ambanelli; Michele Favalli; Piero Olivo; Bruno Riccò (EURO-DAC, 1991)

A probabilistic fault model for analog faults. - Michele Favalli; Piero Olivo; Bruno Riccò (EURO-DAC, 1991)

Fault simulation for general FCMOS ICs. - Michele Favalli; Piero Olivo; Bruno Riccò; Fabio Somenzi (J. Electron. Test., 1991)

Analysis and Design of Linear Finite State Machines for Signature Analysis Testing. - Maurizio Damiani; Piero Olivo; Bruno Riccò (IEEE Trans. Computers, 1991)

Fault simulation of unconventional faults in CMOS circuits. - Michele Favalli; Piero Olivo; Maurizio Damiani; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

A novel critical path heuristic for fast fault grading. - Michele Favalli; Piero Olivo; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. - Marcello Dalpasso; Michele Favalli; Piero Olivo; Bruno Riccò (ITC, 1992)

Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. - Michele Favalli; Marcello Dalpasso; Piero Olivo; Bruno Riccò (ITC, 1992)

CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. - Cecilia Metra; Michele Favalli; Piero Olivo; Bruno Riccò (ITC, 1992)

Dynamic effects in the detection of bridging faults in CMOS ICs. - Michele Favalli; Piero Olivo; Bruno Riccò (J. Electron. Test., 1992)

Testability measures in pseudorandom testing. - Silvia Ercolani; Michele Favalli; Maurizio Damiani; Piero Olivo; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

A probabilistic fault model for 'analog' faults in digital CMOS circuits. - Michele Favalli; Piero Olivo; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block. - Cecilia Metra; Michele Favalli; Piero Olivo; Bruno Riccò (DFT, 1993)

A Highly Testable 1-out-of-3 CMOS Checker. - Cecilia Metra; Michele Favalli; Piero Olivo; Bruno Riccò (DFT, 1993)

Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. - Michele Favalli; Marcello Dalpasso; Piero Olivo; Bruno Riccò (ITC, 1993)

Fault simulation of parametric bridging faults in CMOS IC's. - Marcello Dalpasso; Michele Favalli; Piero Olivo; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)

Analysis of resistive bridging fault detection in BiCMOS digital ICs. - Michele Favalli; Marcello Dalpasso; Piero Olivo; Bruno Riccò (IEEE Trans. Very Large Scale Integr. Syst., 1993)

An experimental study of testing techniques for bridging faults in CMOS ICs. - Massimo Lanzoni; Michele Favalli; M. Ambanelli; Piero Olivo; Bruno Riccò (IEEE J. Solid State Circuits, 1993)

Modeling of Broken Connections Faults in CMOS ICs. - Michele Favalli; Marcello Dalpasso; Piero Olivo; Bruno Riccò (EDAC-ETC-EUROASIC, 1994)

Correlation between IDDQ testing quality and sensor accuracy. - Marcello Dalpasso; Michele Favalli; Piero Olivo (ED&TC, 1995)

Reliability evaluation of combinational logic circuits by symbolic simulation. - Alessandro Bogliolo; Maurizio Damiani; Piero Olivo; Bruno Riccò (VTS, 1995)

Test pattern generation for IDDQ: increasing test quality. - Marcello Dalpasso; Michele Favalli; Piero Olivo (VTS, 1995)

Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. - Cecilia Metra; Michele Favalli; Piero Olivo; Bruno Riccò (J. Electron. Test., 1995)

Self-Learning Signature Analysis for Non-Volatile Memory Testing. - Piero Olivo; Marcello Dalpasso (ITC, 1996)

Modeling and simulation of broken connections in CMOS IC's. - Michele Favalli; Marcello Dalpasso; Piero Olivo (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996)

Flash memory cells-an overview. - Paolo Pavan; Roberto Bez; Piero Olivo; Enrico Zanoni (Proc. IEEE, 1997)

On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits. - Cecilia Metra; Michele Favalli; Piero Olivo; Bruno Riccò (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

A Bist Scheme for Non-Volatile Memories. - Piero Olivo; Marcello Dalpasso (J. Electron. Test., 1998)

Automated test equipment for research on nonvolatile memories. - Paolo Pellati; Piero Olivo (IEEE Trans. Instrum. Meas., 2001)

Overerase phenomena: an insight into flash memory reliability. - Andrea Chimenton; Paolo Pellati; Piero Olivo (Proc. IEEE, 2003)

Reliability of erasing operation in NOR-Flash memories. - Andrea Chimenton; Piero Olivo (Microelectron. Reliab., 2005)

Improving performance and reliability of NOR-Flash arrays by using pulsed operation. - Andrea Chimenton; Fernanda Irrera; Piero Olivo (Microelectron. Reliab., 2006)

Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability Tradeoff. - Cristian Zambelli; Davide Bertozzi; Andrea Chimenton; Piero Olivo (IEEE Embed. Syst. Lett., 2011)

A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. - Cristian Zambelli; Marco Indaco; Michele Fabiano; Stefano Di Carlo; Paolo Prinetto; Piero Olivo; Davide Bertozzi (DATE, 2012)

Modeling of SET seasoning effects in Phase Change Memory arrays. - Cristian Zambelli; Andrea Chimenton; Piero Olivo (Microelectron. Reliab., 2012)

System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems. - Lorenzo Zuolo; Gabriele Miorandi; Cristian Zambelli; Piero Olivo; Davide Bertozzi (ISSoC, 2013)

SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives. - Lorenzo Zuolo; Cristian Zambelli; Rino Micheloni; Salvatore Galfano; Marco Indaco; Stefano Di Carlo; Paolo Prinetto; Piero Olivo; Davide Bertozzi (DATE, 2014)

FLARES: An Aging Aware Algorithm to Autonomously Adapt the Error Correction Capability in NAND Flash Memories. - Stefano Di Carlo; Salvatore Galfano; Marco Indaco; Paolo Prinetto; Davide Bertozzi; Piero Olivo; Cristian Zambelli (ACM Trans. Archit. Code Optim., 2014)

Automated characterization of TAS-MRAM test arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Jérémy Alvarez-Herault; Ken Mackay (DTIS, 2015)

RRAM Reliability/Performance Characterization through Array Architectures Investigations. - Cristian Zambelli; Alessandro Grossi; Piero Olivo; Christian Walczyk; Christian Wenger (ISVLSI, 2015)

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Jérémy Alvarez-Herault; Ken Mackay (NVMTS, 2015)

Design space exploration of latency and bandwidth in RRAM-based solid state drives. - Lorenzo Zuolo; Cristian Zambelli; Rino Micheloni; Stephen Bates; Piero Olivo (NVMTS, 2015)

SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives. - Lorenzo Zuolo; Cristian Zambelli; Rino Micheloni; Marco Indaco; Stefano Di Carlo; Paolo Prinetto; Davide Bertozzi; Piero Olivo (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers. - Davide Bertozzi; Stefano Di Carlo; Salvatore Galfano; Marco Indaco; Piero Olivo; Paolo Prinetto; Cristian Zambelli (ACM Trans. Embed. Comput. Syst., 2015)

Reliability of 3D NAND Flash Memories. - Alessandro Grossi; Cristian Zambelli; Piero Olivo (3D Flash Memories, 2016)

Architectural and Integration Options for 3D NAND Flash Memories. - Rino Micheloni; Luca Crippa; Cristian Zambelli; Piero Olivo (Comput., 2017)

Solid-State Drives (SSDs) [Scanning the Issue]. - Rino Micheloni; Piero Olivo (Proc. IEEE, 2017)

Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance. - Lorenzo Zuolo; Cristian Zambelli; Rino Micheloni; Piero Olivo (Proc. IEEE, 2017)

Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs. - Cristian Zambelli; Marco Castellari; Piero Olivo; Davide Bertozzi (NGCAS, 2018)

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage. - Francesco Pieri; Cristian Zambelli; Andrea Nannini; Piero Olivo; Sergio Saponara (IEEE Consumer Electron. Mag., 2018)

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. - Alessandro Grossi; Cristian Zambelli; Piero Olivo; Paolo Pellati; Michele Ramponi; Christian Wenger; Jérémy Alvarez-Herault; Ken Mackay (IEEE Trans. Emerg. Top. Comput., 2018)

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM. - Alessandro Grossi; Elisa Vianello; Cristian Zambelli; Pablo Royer; Jean-Philippe Noel; Bastien Giraud; Luca Perniola; Piero Olivo; Etienne Nowak (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Low-energy inference machine with multilevel HfO2 RRAM arrays. - Valerio Milo; Cristian Zambelli; Piero Olivo; Eduardo Pérez; Oscar Gonzalez Ossorio; Christian Wenger; Daniele Ielmini (ESSDERC, 2019)

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing. - Mamathamba Kalishettyhalli Mahadevaiah; Eduardo Pérez; Christian Wenger; Alessandro Grossi; Cristian Zambelli; Piero Olivo; Finn Zahari; Hermann Kohlstedt; Martin Ziegler 004 (IRPS, 2019)

Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD. - Cristian Zambelli; Riccardo Bertaggia; Lorenzo Zuolo; Rino Micheloni; Piero Olivo (IEEE Trans. Circuits Syst. II Express Briefs, 2019)

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives. - Lorenzo Zuolo; Cristian Zambelli; Alessia Marelli; Rino Micheloni; Piero Olivo (IEEE Trans. Emerg. Top. Comput., 2019)

Optimized programming algorithms for multilevel RRAM in hardware neural networks. - Valerio Milo; Francesco Anzalone; Cristian Zambelli; Eduardo Pérez; Mamathamba Kalishettyhalli Mahadevaiah; Oscar Gonzalez Ossorio; Piero Olivo; Christian Wenger; Daniele Ielmini (IRPS, 2021)

Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators. - Artem Glukhov; Valerio Milo; Andrea Baroni; Nicola Lepri; Cristian Zambelli; Piero Olivo; Eduardo Pérez; Christian Wenger; Daniele Ielmini (IRPS, 2022)

Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory. - Piergiulio Mannocci; Andrea Baroni; Enrico Melacarne; Cristian Zambelli; Piero Olivo; Eduardo Pérez; Christian Wenger; Daniele Ielmini (ISCAS, 2022)

End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays. - Artem Glukhov; Nicola Lepri; Valerio Milo; Andrea Baroni; Cristian Zambelli; Piero Olivo; Eduardo Pérez; Christian Wenger; Daniele Ielmini (VLSI-SoC, 2022)

Leveraging Large-Scale TLC 3D NAND Flash Characterization to Investigate Early Lifetime Reliability of SSDs through Extreme Value Statistics. - Rino Micheloni; Luca Crippa; Alessia Marelli; Lorenzo Zuolo; Piero Olivo; Cristian Zambelli (IRPS, 2025)