Identification of abnormal events by data monitoring: Application to complex systems. - Pierre Bect; Zineb Simeu-Abazi; Pierre-Loic Maisonneuve (Comput. Ind., 2015)

Allocating Reticles in an Automated Stocker for Semiconductor Manufacturing Facility. - Anna Benzoni; Claude Yugma; Pierre Bect; Alain Planchais (WSC, 2020)