Reliability study of Power RF LDMOS for Radar Application. - Hichame Maanane; Pierre Bertram; Jérôme Marcon; Mohamed Masmoudi; Mohamed Ali Belaïd; Karine Mourgues; Philippe Eudeline; K. Ketata (Microelectron. Reliab., 2004)

Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. - M. Gares; Hichame Maanane; Mohamed Ali Belaïd; Mohamed Masmoudi; Jérôme Marcon; Karine Mourgues; Pierre Bertram; Philippe Eudeline (CCECE, 2006)

Hot carrier reliability of RF N- LDMOS for S Band radar application. - M. Gares; Hichame Maanane; Mohamed Masmoudi; Pierre Bertram; Jérôme Marcon; Mohamed Ali Belaïd; Karine Mourgues; C. Tolant; Philippe Eudeline (Microelectron. Reliab., 2006)