Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors. - Juan Esteban Montoya Cardona; Sylvain Joblot; Pierre Kermagoret; Grégoire Ducotey; Stéphane Hardillier; Guillaume Dupeux; Yannick Borde; Jean-Pierre Carrère; Sandrine Lhostis; Richard Monflier; Olivier Marcelot; Vincent Goiffon (IEEE SENSORS, 2024)