Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices. - K. Adokanou; Karim Inal; Pierre Montmitonnet; F. Pressecq; Barbara Bonnet; J. L. Muraro (Microelectron. Reliab., 2015)

Electromigration-induced failure in operando characterization of 3D interconnects: microstructure influence. - Simon Gousseau; Stéphane Moreau; David Bouchu; Alexis Farcy; Pierre Montmitonnet; Karim Inal; François Bay; Marc Zelsmann; Emmanuel Picard; Mathieu Salaün (Microelectron. Reliab., 2015)

Robust design of thermo-mechanical MEMS switch embedded in aluminium BEOL interconnect. - Sebastian Orellana; Brice Arrazat; Pascal Fornara; Christian Rivero; Sylvain Blayac; Pierre Montmitonnet; Karim Inal (Microelectron. Reliab., 2015)