Lifetime modeling of intrinsic gate oxide breakdown at high temperature. - R. Moonen; Piet Vanmeerbeek; G. Lekens; Ward De Ceuninck; Peter Moens; J. Boutsen (Microelectron. Reliab., 2007)

Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. - R. Charavel; Jaume Roig; S. Mouhoubi; P. Gassot; Filip Bauwens; Piet Vanmeerbeek; B. Desoete; Peter Moens; Eddy De Backer (Microelectron. Reliab., 2010)

Electric field unbalance for robust floating ring termination. - Ana Villamor-Baliarda; Piet Vanmeerbeek; Jaume Roig; Peter Moens; David Flores (Microelectron. Reliab., 2011)

Influence of charge balance on the robustness of trench-based super junction diodes. - Ana Villamor-Baliarda; Piet Vanmeerbeek; Michele Riccio; Vincenzo d'Alessandro; Andrea Irace; Jaume Roig; David Flores; Peter Moens (Microelectron. Reliab., 2012)

Technology and design of GaN power devices. - Peter Moens; Abhishek Banerjee 003; P. Coppens; Aurore Constant; Piet Vanmeerbeek; Z. Li; F. Declercq; L. De Schepper; H. De Vleeschouwer; C. Liu; B. Padmanabhan; W. Jeon; et al. (ESSDERC, 2015)

Trapping induced parasitic effects in GaN-HEMT for power switching applications. - Gaudenzio Meneghesso; Matteo Meneghini; Enrico Zanoni; Piet Vanmeerbeek; Peter Moens (ICICDT, 2015)

Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors. - Matteo Meneghini; Riccardo Silvestri; Stefano Dalcanale; Davide Bisi; Enrico Zanoni; Gaudenzio Meneghesso; Piet Vanmeerbeek; Abhishek Banerjee 003; Peter Moens (IRPS, 2015)

$ mathrm{R}_{ text{ON}}$ and $ mathrm{V}_{ text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout. - Davide Favero; Carlo De Santi; Arno Stockman; Arianna Nardo; Piet Vanmeerbeek; Marnix Tack; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2024)

Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate Bias. - S. L. Longato; Davide Favero; Arno Stockman; Arianna Nardo; Piet Vanmeerbeek; Marnix Tack; Gaudenzio Meneghesso; Enrico Zanoni; C. De Santi; Matteo Meneghini (IRPS, 2025)