Computation of DNA-based parameters from chromosome scans. - Frans C. A. Groen; Piet W. Verbeek; M. van der Ploeg (Digital Image Processing, 1977)

Three-Dimensional Skeletonization: Principle and Algorithm. - Steven Lobregt; Piet W. Verbeek; Frans C. A. Groen (IEEE Trans. Pattern Anal. Mach. Intell., 1980)

The smallest box around a package. - Frans C. A. Groen; Piet W. Verbeek; N. de Jong; J. W. Klumper (Pattern Recognit., 1981)

Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware. - Frans A. Gerritsen; Piet W. Verbeek (Comput. Vis. Graph. Image Process., 1984)

A class of sampling-error free measures in oversampled band-limited images. - Piet W. Verbeek (Pattern Recognit. Lett., 1985)

Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space. - Piet W. Verbeek; Leo Dorst; Ben J. H. Verwer; Frans C. A. Groen (IAS, 1986)

An Efficient Uniform Cost Algorithm Applied to Distance Transforms. - Ben J. H. Verwer; Piet W. Verbeek; Simon T. Dekker (IEEE Trans. Pattern Anal. Mach. Intell., 1989)

2-D adaptive smoothing by 3-D distance transformation. - Piet W. Verbeek; Ben J. H. Verwer (Pattern Recognit. Lett., 1989)

Shading from shape, the eikonal equation solved by grey-weighted distance transform. - Piet W. Verbeek; Ben J. H. Verwer (Pattern Recognit. Lett., 1990)

An estimator of edge length and surface area in digitized 2D and 3D images. - Piet W. Verbeek; Lucas J. van Vliet (ICPR (3), 1992)

Line and edge detection by symmetry filters. - Piet W. Verbeek; Lucas J. van Vliet (ICPR (3), 1992)

Binary and Grey-Value Skeletons: Metrics and Algorithms. - Ben J. H. Verwer; Lucas J. van Vliet; Piet W. Verbeek (Int. J. Pattern Recognit. Artif. Intell., 1993)

On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images. - Piet W. Verbeek; Lucas J. van Vliet (IEEE Trans. Pattern Anal. Mach. Intell., 1994)

Edge localization by MoG filters: Multiple-of-Gaussians. - Lucas J. van Vliet; Piet W. Verbeek (Pattern Recognit. Lett., 1994)

High-speed acquisition of range images. - Michiel de Bakker; Piet W. Verbeek; Frank van den Ouden; Gijs K. Steenvoorden (ICPR, 1996)

Fast analytical medial-axis localization in convex polyhedra. - Maarten P. P. Schlicher; Erik Bouts; Piet W. Verbeek (ICPR, 1996)

Block position dithering in DCT-coded sequences. - Marnix K. N. Schöyer; Piet W. Verbeek (Signal Process. Image Commun., 1996)

Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer. - Michiel de Bakker; Piet W. Verbeek; Gijs K. Steenvoorden (3DIM, 1997)

On the Application of Neural Networks to Non-Linear Image Processing Tasks. - Dick de Ridder; Robert P. W. Duin; Piet W. Verbeek; Lucas J. van Vliet (ICONIP, 1998)

Improved curvature and anisotropy estimation for curved line bundles. - Piet W. Verbeek; Lucas J. van Vliet; Joost van de Weijer 001 (ICPR, 1998)

Recursive Gaussian derivative filters. - Lucas J. van Vliet; Ian T. Young; Piet W. Verbeek (ICPR, 1998)

Edge Preserving Orientation Adaptive Filtering. - Peter Bakker; Lucas J. van Vliet; Piet W. Verbeek (CVPR, 1999)

The Applicability of Neural Networks to Non-linear Image Processing. - Dick de Ridder; Robert P. W. Duin; Piet W. Verbeek (Pattern Anal. Appl., 1999)

Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images. - René G. de Vries; Piet W. Verbeek (ICPR, 2000)

Confidence and Curvature Estimation of Curvilinear Structures in 3-D. - Peter Bakker; Lucas J. van Vliet; Piet W. Verbeek (ICCV, 2001)

Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields. - Joost van de Weijer 001; Lucas J. van Vliet; Piet W. Verbeek; Michael van Ginkel (IEEE Trans. Pattern Anal. Mach. Intell., 2001)

The Effect of Gamma and Chroma on the Perception of Color Images. - Judith Dijk; Piet W. Verbeek; Jan Walraven; Ian T. Young (CGIV, 2002)

Curvature Estimation of Surfaces in 3D Grey-Value Images. - Bernd Rieger; Frederik J. Timmermans; Lucas J. van Vliet; Piet W. Verbeek (ICPR (1), 2002)

A New Sharpness Measure Based on Gaussian Lines and Edges. - Judith Dijk; Michael van Ginkel; Rutger J. van Asselt; Lucas J. van Vliet; Piet W. Verbeek (CAIP, 2003)

The Generalised Radon Transform: Sampling and Memory Considerations. - Cris L. Luengo Hendriks; Michael van Ginkel; Piet W. Verbeek; Lucas J. van Vliet (CAIP, 2003)

The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement. - Piet W. Verbeek; Judith Dijk (CAIP, 2003)

Robust Curve Detection Using a Radon Transform in Orientation Space. - Michael van Ginkel; M. A. Kraaijveld; Lucas J. van Vliet; E. P. Reding; Piet W. Verbeek; H. J. Lammers (SCIA, 2003)

Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images. - Bernd Rieger; Lucas J. van Vliet; Piet W. Verbeek (SCIA, 2003)

Quantitative Imaging: How to Measure Size Features in Digitized Images. - Lucas J. van Vliet; Piet W. Verbeek; Ian T. Young (ISBI, 2004)

On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors. - Bernd Rieger; Frederik J. Timmermans; Lucas J. van Vliet; Piet W. Verbeek (IEEE Trans. Pattern Anal. Mach. Intell., 2004)

The generalized Radon transform: Sampling, accuracy and memory considerations. - Cris L. Luengo Hendriks; Michael van Ginkel; Piet W. Verbeek; Lucas J. van Vliet (Pattern Recognit., 2005)

Lightness filtering in color images with respect to the gamut. - Judith Dijk; Piet W. Verbeek (CGIV, 2006)

Continuous Orientation Representation for Arbitrary Dimensions - A Generalized Knutsson Mapping. - Bernd Rieger; Lucas J. van Vliet; Piet W. Verbeek (SCIA, 2011)