Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. - Georges G. E. Gielen; Pieter De Wit; Elie Maricau; Johan Loeckx; Javier Martín-Martínez; Ben Kaczer; Guido Groeseneken; Rosana Rodríguez; Montserrat Nafría (DATE, 2008)

A fully-integrated Wienbridge topology for ultra-low-power 86ppm/°C 65nm CMOS 6MHz clock reference with amplitude regulation. - Valentijn De Smedt; Pieter De Wit; Wim Vereecken; Michiel Steyaert (ESSCIRC, 2008)

An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. - Elie Maricau; Pieter De Wit; Georges G. E. Gielen (Microelectron. Reliab., 2008)

A 66 µW 86 ppm° C Fully-Integrated 6 MHz Wienbridge Oscillator With a 172 dB Phase Noise FOM. - Valentijn De Smedt; Pieter De Wit; Wim Vereecken; Michiel S. J. Steyaert (IEEE J. Solid State Circuits, 2009)

Erratum to "A 66 µW 86 ppm°C Fully-Integrated 6 MHz Wienbridge Oscillator With a 172 dB Phase Noise FOM" [Jul 09 1990-2001]. - Valentijn De Smedt; Pieter De Wit; Wim Vereecken; Michiel Steyaert (IEEE J. Solid State Circuits, 2009)

Design automation towards reliable analog integrated circuits. - Georges G. E. Gielen; Elie Maricau; Pieter De Wit (ICCAD, 2010)

Efficient simulation model for DAC dynamic properties. - Pieter De Wit; Georges G. E. Gielen (ISCAS, 2010)

Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. - Georges G. E. Gielen; Elie Maricau; Pieter De Wit (DATE, 2011)

A failure-resilient xDSL line driver with on-chip degradation monitor. - Pieter De Wit; Georges G. E. Gielen (ESSCIRC, 2011)

Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. - Simon Vanden Bussche; Pieter De Wit; Elie Maricau; Georges G. E. Gielen (ICECS, 2011)

Designing reliable analog circuits in an unreliable world. - Georges G. E. Gielen; Elie Maricau; Pieter De Wit (CICC, 2012)

Offset measurement method for accurate characterization of BTI-induced degradation in opamps. - Swaraj Mahato; Pieter De Wit; Elie Maricau; Georges G. E. Gielen (ICECS, 2012)

Degradation-Resilient Design of a Self-Healing xDSL Line Driver in 90 nm CMOS. - Pieter De Wit; Georges G. E. Gielen (IEEE J. Solid State Circuits, 2012)