Integration test effort in sap r/3 systems. - P. A. van de Griend; Rob J. Kusters (J. Softw. Evol. Process., 2012)

Towards Log-Driven Monitoring of Technical Degradation: An ERP Perspective. - Pieter van de Griend; Rob J. Kusters; Jos J. M. Trienekens (BMSD, 2023)

Defect repair efficacy in ERP production systems. - Pieter van de Griend; Rob J. Kusters; Jos J. M. Trienekens (CENTERIS/ProjMAN/HCist, 2023)