A Golden Block Self-Generating Scheme for Continuous Patterned Wafer Inspections. - Sheng Uei Guan; Pin Xie (ICIAP, 1999)

A golden-template self-generating method for patterned wafer inspection. - Pin Xie; Sheng Uei Guan (Mach. Vis. Appl., 2000)

A golden-block-based self-refining scheme for repetitive patterned wafer inspections. - Sheng Uei Guan; Pin Xie; Hong Li (Mach. Vis. Appl., 2003)