Virtual Quality Assurance Facilitation Model. - Rajesh Agarwal; Pinakpani Nayak; Manickam Malarvizhi; P. Suresh; Nina Modi (ICGSE, 2007)

Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. - Anisur Rahman; Javier Dacuña; Pinakpani Nayak; Gerald S. Leatherman; Stephen Ramey (IRPS, 2018)

A Reliability Overview of Intel's 10+ Logic Technology. - Rohit Grover; Tony Acosta; C. AnDyke; Emre Armagan; C. Auth; Sunny Chugh; K. Downes; M. Hattendorf; N. Jack; S. Joshi; R. Kasim; Gerald S. Leatherman; et al. (IRPS, 2020)