An Approach to Modeling and Testing Memories and Its Application to CAMs. - Piotr R. Sidorowicz; Janusz A. Brzozowski (VTS, 1998)

Modeling and Testing Transistor Faults in Content-Addressable Memories. - Piotr R. Sidorowicz (MTDT, 1999)

A framework for testing special-purpose memories. - Piotr R. Sidorowicz; Janusz A. Brzozowski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)