Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. - Fang Liu 029; Plamen K. Nikolov; Sule Ozev (VTS, 2006)

Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling. - Fang Liu 029; Sule Ozev; Plamen K. Nikolov (ACM Trans. Design Autom. Electr. Syst., 2008)