Spatio-Temporal Anomaly Detection for Substrate Strip Bin Map in Semiconductor Assembly Process. - Po-Cheng Shen; Meng-Xiu Lu; Chia-Yen Lee (IEEE Robotics Autom. Lett., 2022)

Upsampling Algorithm for V-PCC-Coded 3D Point Clouds. - Ting-Lan Lin; Bing-Wei Su; Po-Cheng Shen; Ding-Yuan Chen; Chi-Fu Liang; Yan-Cheng Chen; Yangming Wen; Mohammad Shahid (ACM Trans. Multim. Comput. Commun. Appl., 2024)