Effects of different drop test conditions on board-level reliability of chip-scale packages. - Yi-Shao Lai; Po-Chuan Yang; Chang-Lin Yeh (Microelectron. Reliab., 2008)

Modeling of decentralized linear observer and tracker for a class of unknown interconnected large-scale sampled-data nonlinear systems with closed-loop decoupling property. - Jason Sheng-Hong Tsai; Nien-Tsu Hu; Po-Chuan Yang; Shu-Mei Guo; Leang-San Shieh (Comput. Math. Appl., 2010)